Fault diagnosis and prognostics are key technologies in prognostics and health management(PHM). By combining
the design of testability with fault models and mechanism, the architecture of integrated diagnostic and fault prognostics
based on testability is proposed. The current developed techniques and methods of integrated diagnostics and prognostics are
classified and summarized. The methods of integrated diagnostics and prognostics are discussed from embedded diagnostics
based on testability, intelligent fault diagnosis based on signal process, and fault prognostics based on testability in electronic
system. Finally, the factors that constrain the developments of integrated diagnostics and prognostics in electronic system
are analyzed and the developing trend is also discussed.