In order to solve the problems of high time overhead and low accuracy in test point selection algorithms of analog circuit fault dictionary, an approach based on artificial immune algorithm(AIA) is proposed. Firstly, the integer-coded fault-wise table is established and the problem of test point selection is analysed. Then the AIA is applied to the test point selection problem. Finally, the simulation results in the test point selection show that the approach not only can find the global optimal solution, but also can reduce the cost of time.