平板导电结构缺陷脉冲涡流和超声复合检测方法
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作者单位:

(浙江大学控制科学与工程学院,杭州310027)

作者简介:

黄平捷(1974-), 男, 副教授, 博士, 从事无损检测、计算机控制技术等研究;彭谢丹(1991-), 女, 硕士生, 从事涡流无损检测的研究.

通讯作者:

E-mail: huangpingjie@zju.edu.cn.

中图分类号:

U28

基金项目:

国家自然科学基金项目(U1509208, 61174005);中央高校基本科研业务费专项资金项目(2017FZA5011);国家科技重大专项子项目(2016ZX0517-003)及课题任务(31300028-18-ZC0613-0002).


Pulsed eddy current and ultrasonic complex testing method for defect detection of planar conductive structures
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(College of Control Science and Engineering,Zhejiang University,Hangzhou310027,China)

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    摘要:

    面向平板导电结构不同深度缺陷检测需求,针对脉冲涡流和超声单一检测方法能力受限,即脉冲涡流对深层缺陷检测能力降低与超声对表面和近表面缺陷检测效果不佳的问题,提出利用两传感器信息互补的Dempster-Shafter(D-S)证据理论复合检测方法.针对脉冲涡流和超声两种检测方式适用检测区域不同而引起的证据冲突问题,研究加权分配方法加以解决.对于单传感器检测过程中可能存在误报情况的问题,研究将实际误报率考虑在内的贝叶斯推理方法以求得单一传感器检测结果的基本概率分配函数并作为D-S证据.将带有不同深度缺陷的平板导电结构作为实验对象,通过单一传感器检测、贝叶斯估计、D-S证据理论方法进行不同深度位置的缺陷检测,结果表明,使用引入加权分配的D-S证据推理方法时,缺陷检测准确性和检测范围均有所提高.

    Abstract:

    A complex detection method which combines plused eddy current(PEC) and ultrasonic testing(UT) based on the Dempster-Shafter(D-S) evidence theory is proposed to detect the defects in the planar conductive structures at different depth locations. It intends to overcome the testing limitation that PEC testing is poor in deep defects detection and UT performes bad in surface and near-surface defects respectively. To solve the conflict problem of different detection ranges of PEC and UT, the weighted distribution processing is studied and added to the D-S evidence theory. To consider the posibility of false positives in single sensor detection, the evidence, i.e. posibility of defect from single sensor, is improved by using the Bayesian inference method. The experiment is carried out on a planar conductive structure testing sample with different depths of the defects. By comparing with the single sensor testing and Bayesian estimation method, results show that the proposed technique using D-S evidence theory with the weighted distribution processing in the combined testing obtains better defect detection result and wider testing scale.

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黄平捷,彭谢丹,赵树浩,等.平板导电结构缺陷脉冲涡流和超声复合检测方法[J].控制与决策,2019,34(4):743-750

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  • 在线发布日期: 2019-03-21
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